Thermal Coupling in AlGaN/GaN Power Transistors

Thermal coupling in AlGaN/GaN transistors is investigated by means of thermal FEM (finite element method) simulation. The results are combined with electrical network simulation using an electro-thermal model. From the FEM analysis the thermal coupling matrix is established, describing the thermal i...

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Veröffentlicht in:Frequenz 2013-01, Vol.67 (1), p.21-26
Hauptverfasser: Schnieder, Frank, Rudolph, Matthias
Format: Artikel
Sprache:eng
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Zusammenfassung:Thermal coupling in AlGaN/GaN transistors is investigated by means of thermal FEM (finite element method) simulation. The results are combined with electrical network simulation using an electro-thermal model. From the FEM analysis the thermal coupling matrix is established, describing the thermal interaction between the different cells of a power transistor. The matrix allows to extract an equivalent circuit for the thermal coupling in a straightforward way. The electrical transistor model is complemented by thermal ports to connect the cells via the thermal coupling network. The electro-thermal model developed yields information on the distribution of temperature and currents within a powerbar and thus is an important tool in transistor design.
ISSN:0016-1136
2191-6349
DOI:10.1515/freq-2012-1031