Impedance-based interpretations in 2-dimensional electron gas conduction formed in the LaAlO sub(3)/Sr sub(x)Ca sub(1-x)TiO sub(3)/SrTiO sub(3) system

Frequency-dependent impedance spectroscopy was applied to the 2-dimensioanl conduction transport in the LaAlO sub(3)/Sr sub(x)Ca sub(1-x)TiO sub(3)/SrTiO sub(3) system. The 2-dimensional conduction modifies the electrical/dielectric responses of the LaAlO sub(3)/Sr sub(x)Ca sub(1-x)TiO sub(3)/SrTiO...

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Veröffentlicht in:The Journal of physics and chemistry of solids 2016-06, Vol.93, p.131-136
Hauptverfasser: Parka, Chan-Rok, Moonb, Seon Young, Parka, Da-Hee, Kimb, Shin-Ik, Kimb, Seong-Keun, Kangb, Chong-Yun, Baekb, Seung-Hyub, Choib, Jung-Hae, Kimb, Jin-Sang, Choic, Eunsoo, Hwanga, Jin-Ha
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Sprache:eng
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Zusammenfassung:Frequency-dependent impedance spectroscopy was applied to the 2-dimensioanl conduction transport in the LaAlO sub(3)/Sr sub(x)Ca sub(1-x)TiO sub(3)/SrTiO sub(3) system. The 2-dimensional conduction modifies the electrical/dielectric responses of the LaAlO sub(3)/Sr sub(x)Ca sub(1-x)TiO sub(3)/SrTiO sub(3) depending on the magnitude of the interfacial 2-dimensional resistance. The high conduction of the 2-dimensional electron gas (2DEG) layer can be described using a metallic resistor in series with two parallel RC circuits. However, the high resistance of the 2-dimensional layer drives the composite system from a finite low resistor in parallel with the surrounding dielectrics composed of LaAlO sub(3) and SrTiO sub(3) materials to a dielectric capacitor. This change in the resistance of the 2-dimensional layers modifies the overall impedance enabled by the presence of the interfacial layer due to Sr sub(x)Ca sub(1-x)TiO sub(3), which alters the charge transport of the 2-dimensional layer from metallic to semiconducting conduction. A noticeable change is observed in the capacitance Bode plots, indicating highly amplified dielectric constants compared with the pristine SrTiO sub(3) substrates and Sr sub(x)Ca sub(1-x)TiO sub(3) with a greater Ca content.
ISSN:0022-3697
DOI:10.1016/j.jpcs.2016.02.017