The Development of an EM-Field Probing System for Manual Near-Field Scanning

This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electromagnetic compatibility 2016-04, Vol.58 (2), p.356-363
Hauptverfasser: Hui He, Maheshwari, Pratik, Pommerenke, David J.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were achieved by combining magnetic field probing with a system that automatically records the probe's position and orientation. The local magnetic field associated with the probe location was recorded and displayed at near real time on the captured 3-D geometry. Consequently, a field strength map was obtained for EMC applications. Also, a video showing the spreading of the ESD-induced current with subnanosecond resolution was captured for ESD applications after the ESD-induced surface current density associated with the probe location was recorded.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2015.2496376