Anomalous polarization dependence of Raman scattering and crystallographic orientation of black phosphorus

We investigated polarization dependence of the Raman modes in black phosphorus (BP) using five different excitation wavelengths. The crystallographic orientation was determined by comparing polarized optical microscopy with high-resolution transmission electron microscopy analysis. In polarized Rama...

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Veröffentlicht in:Nanoscale 2015-11, Vol.7 (44), p.18708-18715
Hauptverfasser: Kim, Jungcheol, Lee, Jae-Ung, Lee, Jinhwan, Park, Hyo Ju, Lee, Zonghoon, Lee, Changgu, Cheong, Hyeonsik
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Sprache:eng
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Zusammenfassung:We investigated polarization dependence of the Raman modes in black phosphorus (BP) using five different excitation wavelengths. The crystallographic orientation was determined by comparing polarized optical microscopy with high-resolution transmission electron microscopy analysis. In polarized Raman spectroscopy, the B2g mode shows the same polarization dependence regardless of the excitation wavelength or the sample thickness. On the other hand, the Ag(1) and Ag(2) modes show a peculiar polarization behavior that depends on the excitation wavelength and the sample thickness. The thickness dependence can be explained by considering the anisotropic interference effect due to the birefringence and dichroism of the BP crystal, but the wavelength dependence cannot be explained. We propose a simple and fail-proof procedure to determine the orientation of a BP crystal by combining polarized Raman scattering with polarized optical microscopy.
ISSN:2040-3364
2040-3372
DOI:10.1039/c5nr04349b