Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images...

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Veröffentlicht in:	Review of scientific instruments 2013-11, Vol.84 (11), p.113701-113701
Hauptverfasser:	Stirling, Julian, Woolley, Richard A J, Moriarty, Philip
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic structure Automation Contamination Data analysis Data processing Image processing Microscopes Scanning Scanning probe microscopes Scanning probe microscopy Scientific apparatus & instruments Surface structure
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Beschreibung
Zusammenfassung:	We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.4827076