Enhanced interference-pattern visibility using multislit optical superposition method for imaging-type two-dimensional Fourier spectroscopy

A solution is found for the problem of phase cancellation between adjacent bright points in wavefront-division phase-shift interferometry. To this end, a design is proposed that optimizes the visibility of the interference pattern from multiple slits. The method is explained in terms of Fraunhofer diffraction and convolution imaging. Optical simulations verify the technique. The final design can be calculated using a simple equation.