Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer

An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired in situ and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of...

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Veröffentlicht in:CrystEngComm 2016-01, Vol.18 (14), p.244-247
Hauptverfasser: Tsuboi, Chiaki, Aburaya, Kazuaki, Kimura, Fumiko, Maeyama, Masataka, Kimura, Tsunehisa
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Sprache:eng
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Zusammenfassung:An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired in situ and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of the attachment is demonstrated using l -alanine microcrystals (∼5 μm). An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed.
ISSN:1466-8033
1466-8033
DOI:10.1039/c5ce02307f