Single-crystal structure determination from microcrystalline powders (∼5 μm) by an orientation attachment mountable on an in-house X-ray diffractometer
An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired in situ and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of...
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Veröffentlicht in: | CrystEngComm 2016-01, Vol.18 (14), p.244-247 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. Single-crystal diffraction data are acquired
in situ
and analyzed using conventional computer software to determine the crystal structure of the microcrystals. The performance of the attachment is demonstrated using
l
-alanine microcrystals (∼5 μm).
An X-ray attachment that can realize single-crystal X-ray diffraction patterns from microcrystalline powders is proposed. |
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ISSN: | 1466-8033 1466-8033 |
DOI: | 10.1039/c5ce02307f |