Sub-500nm hard x ray focusing by compound long kinoform lenses

Sub-500nm hard x ray focusing by compound long kinoform lenses

The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The exp...

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Veröffentlicht in:Applied optics (2004) 2016-01, Vol.55 (1), p.38-41
Hauptverfasser: Liao, Keliang, Liu, Jing, Liang, Hao, Wu, Xuehui, Zhang, Kai, Yuan, Qingxi, Yi, Futing, Sheng, Weifan
Format: Artikel
Sprache:eng
Schlagworte:
Diffraction efficiency
Focusing
Kinoform
Knife-edge
Lenses
Polymethyl methacrylates
Synchrotron radiation
X-rays
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container_end_page 41
container_issue 1
container_start_page 38
container_title Applied optics (2004)
container_volume 55
creator Liao, Keliang
Liu, Jing
Liang, Hao
Wu, Xuehui
Zhang, Kai
Yuan, Qingxi
Yi, Futing
Sheng, Weifan
description The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency.
doi_str_mv 10.1364/AO.55.000038
format Article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1800503183</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1800503183</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_18005031833</originalsourceid><addsrcrecordid>eNqVirsOgjAYRhujiXjZfICOLsWWUiyLiTEaNwcd3AiXomhpkd8m8vYy-AKe5Tv5chBaMOozHoWr7ckXwqc9XA6QFzAhCGeRGCKv15iwQF7HaALw6AsRxmsPbc4uI4JSU-N72hb4g9u0w6XNHVTmhrMO57ZurDMF1rY_npWxpW1rrJUBBTM0KlMNav7bKVoe9pfdkTStfTkF76SuIFdap0ZZBwmTlArKmeT8j_QLQFFBKg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1800503183</pqid></control><display><type>article</type><title>Sub-500nm hard x ray focusing by compound long kinoform lenses</title><source>Optica Publishing Group Journals</source><creator>Liao, Keliang ; Liu, Jing ; Liang, Hao ; Wu, Xuehui ; Zhang, Kai ; Yuan, Qingxi ; Yi, Futing ; Sheng, Weifan</creator><creatorcontrib>Liao, Keliang ; Liu, Jing ; Liang, Hao ; Wu, Xuehui ; Zhang, Kai ; Yuan, Qingxi ; Yi, Futing ; Sheng, Weifan</creatorcontrib><description>The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency.</description><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>DOI: 10.1364/AO.55.000038</identifier><language>eng</language><subject>Diffraction efficiency ; Focusing ; Kinoform ; Knife-edge ; Lenses ; Polymethyl methacrylates ; Synchrotron radiation ; X-rays</subject><ispartof>Applied optics (2004), 2016-01, Vol.55 (1), p.38-41</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27907,27908</link.rule.ids></links><search><creatorcontrib>Liao, Keliang</creatorcontrib><creatorcontrib>Liu, Jing</creatorcontrib><creatorcontrib>Liang, Hao</creatorcontrib><creatorcontrib>Wu, Xuehui</creatorcontrib><creatorcontrib>Zhang, Kai</creatorcontrib><creatorcontrib>Yuan, Qingxi</creatorcontrib><creatorcontrib>Yi, Futing</creatorcontrib><creatorcontrib>Sheng, Weifan</creatorcontrib><title>Sub-500nm hard x ray focusing by compound long kinoform lenses</title><title>Applied optics (2004)</title><description>The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency.</description><subject>Diffraction efficiency</subject><subject>Focusing</subject><subject>Kinoform</subject><subject>Knife-edge</subject><subject>Lenses</subject><subject>Polymethyl methacrylates</subject><subject>Synchrotron radiation</subject><subject>X-rays</subject><issn>1559-128X</issn><issn>2155-3165</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqVirsOgjAYRhujiXjZfICOLsWWUiyLiTEaNwcd3AiXomhpkd8m8vYy-AKe5Tv5chBaMOozHoWr7ckXwqc9XA6QFzAhCGeRGCKv15iwQF7HaALw6AsRxmsPbc4uI4JSU-N72hb4g9u0w6XNHVTmhrMO57ZurDMF1rY_npWxpW1rrJUBBTM0KlMNav7bKVoe9pfdkTStfTkF76SuIFdap0ZZBwmTlArKmeT8j_QLQFFBKg</recordid><startdate>20160101</startdate><enddate>20160101</enddate><creator>Liao, Keliang</creator><creator>Liu, Jing</creator><creator>Liang, Hao</creator><creator>Wu, Xuehui</creator><creator>Zhang, Kai</creator><creator>Yuan, Qingxi</creator><creator>Yi, Futing</creator><creator>Sheng, Weifan</creator><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20160101</creationdate><title>Sub-500nm hard x ray focusing by compound long kinoform lenses</title><author>Liao, Keliang ; Liu, Jing ; Liang, Hao ; Wu, Xuehui ; Zhang, Kai ; Yuan, Qingxi ; Yi, Futing ; Sheng, Weifan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_18005031833</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Diffraction efficiency</topic><topic>Focusing</topic><topic>Kinoform</topic><topic>Knife-edge</topic><topic>Lenses</topic><topic>Polymethyl methacrylates</topic><topic>Synchrotron radiation</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liao, Keliang</creatorcontrib><creatorcontrib>Liu, Jing</creatorcontrib><creatorcontrib>Liang, Hao</creatorcontrib><creatorcontrib>Wu, Xuehui</creatorcontrib><creatorcontrib>Zhang, Kai</creatorcontrib><creatorcontrib>Yuan, Qingxi</creatorcontrib><creatorcontrib>Yi, Futing</creatorcontrib><creatorcontrib>Sheng, Weifan</creatorcontrib><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liao, Keliang</au><au>Liu, Jing</au><au>Liang, Hao</au><au>Wu, Xuehui</au><au>Zhang, Kai</au><au>Yuan, Qingxi</au><au>Yi, Futing</au><au>Sheng, Weifan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sub-500nm hard x ray focusing by compound long kinoform lenses</atitle><jtitle>Applied optics (2004)</jtitle><date>2016-01-01</date><risdate>2016</risdate><volume>55</volume><issue>1</issue><spage>38</spage><epage>41</epage><pages>38-41</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><abstract>The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency.</abstract><doi>10.1364/AO.55.000038</doi></addata></record>
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source Optica Publishing Group Journals
subjects Diffraction efficiency
Focusing
Kinoform
Knife-edge
Lenses
Polymethyl methacrylates
Synchrotron radiation
X-rays
title Sub-500nm hard x ray focusing by compound long kinoform lenses
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T08%3A15%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sub-500nm%20hard%20x%20ray%20focusing%20by%20compound%20long%20kinoform%20lenses&rft.jtitle=Applied%20optics%20(2004)&rft.au=Liao,%20Keliang&rft.date=2016-01-01&rft.volume=55&rft.issue=1&rft.spage=38&rft.epage=41&rft.pages=38-41&rft.issn=1559-128X&rft.eissn=2155-3165&rft_id=info:doi/10.1364/AO.55.000038&rft_dat=%3Cproquest%3E1800503183%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1800503183&rft_id=info:pmid/&rfr_iscdi=true