Sub-500nm hard x ray focusing by compound long kinoform lenses

Sub-500nm hard x ray focusing by compound long kinoform lenses

The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The exp...

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Veröffentlicht in:Applied optics (2004) 2016-01, Vol.55 (1), p.38-41
Hauptverfasser: Liao, Keliang, Liu, Jing, Liang, Hao, Wu, Xuehui, Zhang, Kai, Yuan, Qingxi, Yi, Futing, Sheng, Weifan
Format: Artikel
Sprache:eng
Schlagworte:
Diffraction efficiency
Focusing
Kinoform
Knife-edge
Lenses
Polymethyl methacrylates
Synchrotron radiation
X-rays
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Zusammenfassung:The focusing performance of polymethyl methacrylate compound long kinoform lenses with 70 [mu]m aperture and 19.5 mm focal length was characterized with 8 keV x rays using the knife-edge scan method at the 4W1A transmission x-ray microscope beamline of Beijing Synchrotron Radiation Facility. The experiment result shows a best FWHM focus size of 440 nm with 31% diffraction efficiency.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.55.000038