Watching Nanoparticles Form: An In Situ (Small-/Wide-Angle X-ray Scattering/Total Scattering) Study of the Growth of Yttria-Stabilised Zirconia in Supercritical Fluids

Understanding nanoparticle‐formation reactions requires multi‐technique in situ characterisation, since no single characterisation technique provides adequate information. Here, the first combined small‐angle X‐ray scattering (SAXS)/wide‐angle X‐ray scattering (WAXS)/total‐scattering study of nanoparticle formation is presented. We report on the formation and growth of yttria‐stabilised zirconia (YSZ) under the extreme conditions of supercritical methanol for particles with Y2O3 equivalent molar fractions of 0, 4, 8, 12 and 25 %. Simultaneous in situ SAXS and WAXS reveals a quick formation (seconds) of sub‐nanometre amorphous material forming larger agglomerates with subsequent slow crystallisation (minutes) into nanocrystallites. The amount of yttria dopant is shown to strongly affect the crystallite size and unit‐cell dimensions. At yttria‐doping levels larger than 8 %, which is known to be the stoichiometry with maximum ionic conductivity, the strain on the crystal lattice is significantly increased. Time‐resolved nanoparticle size distributions are calculated based on whole‐powder‐pattern modelling of the WAXS data, which reveals that concurrent with increasing average particle sizes, a broadening of the particle‐size distributions occur. In situ total scattering provides structural insight into the sub‐nanometre amorphous phase prior to crystallite growth, and the data reveal an atomic rearrangement from six‐coordinated zirconium atoms in the initial amorphous clusters to eight‐coordinated zirconia atoms in stable crystallites. Representative samples prepared ex situ and investigated by transmission electron microscopy confirm a transformation from an amorphous material to crystalline nanoparticles upon increased synthesis duration. Good things come in threes: Yttria‐stabilised zirconia nanoparticle formation and growth in supercritical methanol has been studied in situ using three complementary X‐ray techniques: small‐ and wide‐angle X‐ray scattering and total scattering (see figure). Nanoparticle characteristics such as size, size distribution, crystallinity and structure are revealed in detail throughout the entire synthesis from the initial cluster to the final crystalline particle.