Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particu...

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Veröffentlicht in:Chinese physics B 2016-01, Vol.25 (1), p.632-639
1. Verfasser: 杨亮 向霞 苗心向 李莉 袁晓东 晏中华 周国瑞 吕海兵 郑万国 祖小涛
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Sprache:eng
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Zusammenfassung:Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particulate contaminants on fused silica surface. The simulated results reveal that the contaminant on both the input and output surfaces plays an important role in the electric field mod- ulation of the incident laser. The influences of the shape, size, embedded depth, dielectric constant (er), and the number of contaminant particles on the electric field distribution are discussed in detail. Meanwhile, the corresponding physical mechanism is analyzed theoretically.
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/25/1/014210