X-ray emission from 424-MeV/u C ions impacting on selected target

The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C~(6+) ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of Kβ/Kα is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross s...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Chinese physics B 2016-02, Vol.25 (2), p.143-147
1. Verfasser: 周贤明 程锐 雷瑜 孙渊博 王瑜玉 王兴 徐戈 梅策香 张小安 陈熙萌 肖国青 赵永涛
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C~(6+) ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of Kβ/Kα is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation(BEA), plane wave approximation(PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic(ECPSSR) theoretical predictions. The BEA model with considering the multipleionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented.
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/25/2/023402