Fabrication and Assembly of Cu-RDL-Based 2.5-D Low-Cost Through Silicon Interposer (LC-TSI)
Two-and-a-half-dimensional integration enables high-density interdie connections with low cost. This paper presents a through silicon interposer (TSI) fabrication process and detailed characterization and measurement results of redistribution layers and through silicon vias for low-cost 2.5-D integr...
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Veröffentlicht in: | IEEE design and test 2015-08, Vol.32 (4), p.23-31 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Magazinearticle |
Sprache: | eng |
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Zusammenfassung: | Two-and-a-half-dimensional integration enables high-density interdie connections with low cost. This paper presents a through silicon interposer (TSI) fabrication process and detailed characterization and measurement results of redistribution layers and through silicon vias for low-cost 2.5-D integration. |
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ISSN: | 2168-2356 2168-2364 |
DOI: | 10.1109/MDAT.2015.2424429 |