AMS method for depth profiling of trace elements concentration in materials – Construction and applications

The need to investigate the behavior of solid state materials on the impact/retention/repulsion/contamination/impregnation with special trace elements or radioactive elements has driven us to develop a modified Accelerator Mass Spectrometry (AMS) analyzing method that is able to perform the measurem...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2015-10, Vol.361, p.250-256
Hauptverfasser:	Stan-Sion, C., Enachescu, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	AMS Carbon Concentration depth profiling Construction materials Craters Depth profiling Detectors Impact analysis Trace elements Tungsten
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!