Characterization of nitrogen ion implanted TiO2 photocatalysts by XAFS and XPS
A nitrogen doped TiO2 as a visible-light response photocatalyst was prepared by N+ implantation technique. N+-implanted TiO2 samples promoted the photocatalytic activity for degradation of methylene blue under visible-light irradiation. XANES and XPS analyses indicated two types of chemical state of...
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Veröffentlicht in: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2015-12, Vol.365, p.79-81 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A nitrogen doped TiO2 as a visible-light response photocatalyst was prepared by N+ implantation technique. N+-implanted TiO2 samples promoted the photocatalytic activity for degradation of methylene blue under visible-light irradiation. XANES and XPS analyses indicated two types of chemical state of nitrogen, one photo-catalytically active N substituting the O sites and the other inactive NOx (1⩽x⩽2) species. In the valence band XPS spectrum of the high activity sample, the additional electronic states were observed just above the valence band edge of a TiO2. The electronic state would be originated from the substitutional nitrogen and be responsible for the band gap narrowing, i.e., visible light response of TiO2 photocatalysts. |
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ISSN: | 0168-583X 1872-9584 |
DOI: | 10.1016/j.nimb.2015.04.010 |