A high-resolution multi-reflection time-of-flight mass spectrograph for precision mass measurements at RIKEN/SLOWRI

A high-resolution multi-reflection time-of-flight mass spectrograph for precision mass measurements at RIKEN/SLOWRI

A multi-reflection time-of-flight mass spectrograph (MRTOF-MS) has been implemented at RIKEN to provide high-precision mass measurements of very short-lived nuclei with half-lives down to ⩽10ms. Such measurements are of particular interest for r-process nuclei and trans-Uranium nuclei. We provide a...

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Veröffentlicht in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2014-09, Vol.335, p.39-53
Hauptverfasser: Schury, P., Wada, M., Ito, Y., Arai, F., Naimi, S., Sonoda, T., Wollnik, H., Shchepunov, V.A., Smorra, C., Yuan, C.
Format: Artikel
Sprache:eng
Schlagworte:
Atomic mass
Computer simulation
Contaminants
Electric potential
Electronics
Mass spectroscopy
MRTOF-MS
Nuclei
Resolution
Spectrographs
Voltage
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Zusammenfassung:A multi-reflection time-of-flight mass spectrograph (MRTOF-MS) has been implemented at RIKEN to provide high-precision mass measurements of very short-lived nuclei with half-lives down to ⩽10ms. Such measurements are of particular interest for r-process nuclei and trans-Uranium nuclei. We provide a detailed description of the mechanical construction and electronics implementation of an MRTOF-MS at RIKEN. The resolving power is investigated by numerical simulation and these simulations are compared to experimental observations to understand the effects of voltage and thermal instabilities. The limits of precision and accuracy are investigated using offline ion sources, and the effects of non-isobaric contaminants are reported.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2014.05.016