Power-law scaling regimes for solid-state dewetting of thin films
The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for...
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Veröffentlicht in: | Scripta materialia 2016-04, Vol.116, p.143-146 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for edge retraction is presented that reproduces the retraction distance versus time scalings of simulations for both isotropic and highly-anisotropic films, and is consistent with experiments. The earliest time at which a power-law fit becomes a reasonable approximation is calculated as a function of substrate–film contact angle.
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ISSN: | 1359-6462 1872-8456 |
DOI: | 10.1016/j.scriptamat.2016.01.039 |