Power-law scaling regimes for solid-state dewetting of thin films

The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for...

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Veröffentlicht in:Scripta materialia 2016-04, Vol.116, p.143-146
Hauptverfasser: Zucker, Rachel V., Carter, W. Craig, Thompson, Carl V.
Format: Artikel
Sprache:eng
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Zusammenfassung:The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for edge retraction is presented that reproduces the retraction distance versus time scalings of simulations for both isotropic and highly-anisotropic films, and is consistent with experiments. The earliest time at which a power-law fit becomes a reasonable approximation is calculated as a function of substrate–film contact angle. [Display omitted]
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2016.01.039