Nanocolumnar growth of sputtered ZnO thin films
Sequential sputtering technology was developed for the formation of transparent and conductive very thin films of ZnO doped by Al (AZO) with a nanocolumnar polycrystalline structure. The characterization of their properties, including structural (scanning electron microscopy, X-ray diffractometry),...
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Veröffentlicht in: | Thin solid films 2015-09, Vol.591, p.230-236 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Sequential sputtering technology was developed for the formation of transparent and conductive very thin films of ZnO doped by Al (AZO) with a nanocolumnar polycrystalline structure. The characterization of their properties, including structural (scanning electron microscopy, X-ray diffractometry), electrical (Hall measurements) and optical (visible spectrometry, ellipsometry), was performed. AZO thin films with thicknesses of approximately 100nm were prepared with a pronounced nanocolumnar and (002) textured crystalline structure, sufficient low resistivity (≈10−1Ωcm), satisfactory optical transparency (≈90%) and adequate refractive index (≈2.0) for future applications in biochemical sensors.
•Development of sequential sputtering of very thin ZnO films doped by Al•Substrate temperature (200°C) increased the preferential (002) columnar texture.•Sequential sputtering at a substrate temperature of 200°C enlarged crystallite sizes.•Sequential deposition mode increased the optical transparency in the visible region. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2015.04.009 |