Stability of environmentally friendly paper electronic devices

We have performed bias‐stress measurements and determined the shelf‐life of environmentally friendly paper electronic devices. We have utilized a low‐voltage transistor that has a sorbitol‐based ionic liquid as the electrolyte and a blend of poly(3‐hexylthiophene) and poly(l‐lactic acid) as the semiconductor layer. The bias‐stress measurements revealed that the devices operated below 1V are functioning without degradation, while above 1V an irreversible degradation process, probably due to water‐induced oxidation of the semiconductor. A number of these devices are then used to create more complicated logic with, that is the operation of a NOR‐gate and a one bit memory is demonstrated. A D‐latch manufactured on paper connected on a breadboard using a sample containing five paper transistors and three resistors.