Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests

The objective of this work is to minimize testing cost of analog and RF circuits for which complete specification tests are available. We use an integer linear program (ILP) to eliminate as many tests as possible without exceeding the required defect level. The method leverages correlation among spe...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of electronic testing 2015-12, Vol.31 (5-6), p.479-489
Hauptverfasser:	Sindia, Suraj, Agrawal, Vishwani D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analog CAE) and Design Circuits Circuits and Systems Computer simulation Computer-Aided Engineering (CAD Controllers Covering Defects Electrical Engineering Engineering Monte Carlo methods Optimization Radio frequencies Specifications Testing
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!