Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra
A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay fault...
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| Veröffentlicht in: | Microprocessors and microsystems 2015-11, Vol.39 (8), p.1130-1138 |
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| container_title | Microprocessors and microsystems |
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| creator | Kõusaar, Jaak Ubar, Raimund Devadze, Sergei Raik, Jaan |
| description | A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs. |
| doi_str_mv | 10.1016/j.micpro.2015.05.003 |
| format | Article |
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| identifier | ISSN: 0141-9331 |
| ispartof | Microprocessors and microsystems, 2015-11, Vol.39 (8), p.1130-1138 |
| issn | 0141-9331 1872-9436 |
| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | 7-valued algebra Algebra Algorithms Computer simulation Critical path fault tracing Delay Faults Microprocessors Non-robust and functional sensitization Reasoning TDF Transition delay faults |
| title | Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra |
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