Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay fault...

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Veröffentlicht in:Microprocessors and microsystems 2015-11, Vol.39 (8), p.1130-1138
Hauptverfasser: Kõusaar, Jaak, Ubar, Raimund, Devadze, Sergei, Raik, Jaan
Format: Artikel
Sprache:eng
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Zusammenfassung:A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs.
ISSN:0141-9331
1872-9436
DOI:10.1016/j.micpro.2015.05.003