Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra
A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay fault...
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Veröffentlicht in: | Microprocessors and microsystems 2015-11, Vol.39 (8), p.1130-1138 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A new method is presented for simulating of Transition Delay Faults (TDF) based on the parallel exact critical path tracing for Stuck-at Fault (SAF) analysis and subsequent TDF reasoning. A method is proposed to extend the TDF model, traditionally considered as a class of robustly tested delay faults, to a class of TDFs with extended detection conditions. Three known fault classes of delay fault sensitization are considered: robust, non-robust and functional sensitization of delay faults. Additionally, a new fourth fault class is introduced, called non-robust functionally sensitized delay fault. A novel fault analysis algorithm based on 7-valued algebra is presented, which delivers the fault coverage for all mentioned four types of TDFs. |
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ISSN: | 0141-9331 1872-9436 |
DOI: | 10.1016/j.micpro.2015.05.003 |