The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method
The possibility of correctly using matrix effects in the absorption of analyzed x-ray characteristic radiation, the stopping power of a sample and backward scattering of primary beam electrons when using the x-ray spectrum microanalysis method are considered.
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| Veröffentlicht in: | Measurement techniques 2013-10, Vol.56 (7), p.817-822 |
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| container_end_page | 822 |
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| container_issue | 7 |
| container_start_page | 817 |
| container_title | Measurement techniques |
| container_volume | 56 |
| creator | Zablotskii, A. V. Kuzin, A. Yu Mikheev, N. N. Stepovich, M. A. Todua, P. A. Shirokova, E. V. Filippov, M. N. |
| description | The possibility of correctly using matrix effects in the absorption of analyzed x-ray characteristic radiation, the stopping power of a sample and backward scattering of primary beam electrons when using the x-ray spectrum microanalysis method are considered. |
| doi_str_mv | 10.1007/s11018-013-0288-9 |
| format | Article |
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| subjects | Analytical Chemistry Beams (radiation) Characterization and Evaluation of Materials Electron beams Electrons Energy Fluorescence Mathematical analysis Matrix Measurement Science and Instrumentation Measurement techniques Methods Nuclear radiation Physical Chemistry Physicochemical Measurements Physics Physics and Astronomy Radiation Scattering Spectrum analysis Stopping power Studies X-rays |
| title | The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method |
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