The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

The possibility of correctly using matrix effects in the absorption of analyzed x-ray characteristic radiation, the stopping power of a sample and backward scattering of primary beam electrons when using the x-ray spectrum microanalysis method are considered.

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Bibliographische Detailangaben
Veröffentlicht in:Measurement techniques 2013-10, Vol.56 (7), p.817-822
Hauptverfasser: Zablotskii, A. V., Kuzin, A. Yu, Mikheev, N. N., Stepovich, M. A., Todua, P. A., Shirokova, E. V., Filippov, M. N.
Format: Artikel
Sprache:eng
Schlagworte:
Analytical Chemistry
Beams (radiation)
Characterization and Evaluation of Materials
Electron beams
Electrons
Energy
Fluorescence
Mathematical analysis
Matrix
Measurement Science and Instrumentation
Measurement techniques
Methods
Nuclear radiation
Physical Chemistry
Physicochemical Measurements
Physics
Physics and Astronomy
Radiation
Scattering
Spectrum analysis
Stopping power
Studies
X-rays
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Beschreibung
Zusammenfassung:The possibility of correctly using matrix effects in the absorption of analyzed x-ray characteristic radiation, the stopping power of a sample and backward scattering of primary beam electrons when using the x-ray spectrum microanalysis method are considered.
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-013-0288-9