Carbon out-diffusion mechanism for direct graphene growth on a silicon surface

[Display omitted] Direct growth of graphene on silicon (Si) through chemical vapor deposition has predominantly focused on surface-mediated processes due to the low carbon (C) solubility in Si. However, a considerable quantity of C atoms was incorporated in Si and formed Si1−xCx alloy with a reduced...

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Veröffentlicht in:Acta materialia 2015-09, Vol.96, p.18-23
Hauptverfasser: Kim, Byung-Sung, Lee, Jong Woon, Jang, Yamujin, Choi, Soon Hyung, Cha, Seung Nam, Sohn, Jung Inn, Kim, Jong Min, Joo, Won-Jae, Hwang, Sungwoo, Whang, Dongmok
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Sprache:eng
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Zusammenfassung:[Display omitted] Direct growth of graphene on silicon (Si) through chemical vapor deposition has predominantly focused on surface-mediated processes due to the low carbon (C) solubility in Si. However, a considerable quantity of C atoms was incorporated in Si and formed Si1−xCx alloy with a reduced lattice dimension even in the initial stage of direct graphene growth. Subsequent high temperature annealing promoted active C out-diffusion, resulting in the formation of a graphitic layer on the Si surface. Furthermore, the significantly low thermal conductivity of the Si1−xCx alloy shows that the incorporated C atoms affect the properties of a semiconductor adjacent to the graphene. These findings provide a key guideline for controlling desirable properties of graphene and designing hybrid semiconductor/graphene architectures for various applications.
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2015.06.002