Aberration corrected Lorentz scanning transmission electron microscopy

We present results from an aberration corrected scanning transmission electron microscope which has been customised for high resolution quantitative Lorentz microscopy with the sample located in a magnetic field free or low field environment. We discuss the innovations in microscope instrumentation and additional hardware that underpin the imaging improvements in resolution and detection with a focus on developments in differential phase contrast microscopy. Examples from materials possessing nanometre scale variations in magnetisation illustrate the potential for aberration corrected Lorentz imaging as a tool to further our understanding of magnetism on this lengthscale. •Demonstration of nanometre scale resolution in magnetic field free environment using aberration correction in the scanning transmission electron microscope (STEM).•Implementation of differential phase contrast mode of Lorentz microscopy in aberration corrected STEM with improved sensitivity.•Quantitative imaging of magnetic induction of nanostructures in amorphous and cross-section samples.