Measurement Back-Action in Stacked Graphene Quantum Dots

We present an electronic transport experiment in graphene where both classical and quantum mechanical charge detector back-action on a quantum dot are investigated. The device consists of two stacked graphene quantum dots separated by a thin layer of boron nitride. This device is fabricated by van d...

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Veröffentlicht in:Nano letters 2015-09, Vol.15 (9), p.6003-6008
Hauptverfasser: Bischoff, D, Eich, M, Zilberberg, O, Rössler, C, Ihn, T, Ensslin, K
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Sprache:eng
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Zusammenfassung:We present an electronic transport experiment in graphene where both classical and quantum mechanical charge detector back-action on a quantum dot are investigated. The device consists of two stacked graphene quantum dots separated by a thin layer of boron nitride. This device is fabricated by van der Waals stacking and is equipped with separate source and drain contacts to both dots. By applying a finite bias to one quantum dot, a current is induced in the other unbiased dot. We present an explanation of the observed measurement-induced current based on strong capacitive coupling and energy dependent tunneling barriers, breaking the spatial symmetry in the unbiased system. This is a special feature of graphene-based quantum devices. The experimental observation of transport in classically forbidden regimes is understood by considering higher-order quantum mechanical back-action mechanisms.
ISSN:1530-6984
1530-6992
DOI:10.1021/acs.nanolett.5b02167