Spectral–temporal description of dispersive wave emission and soliton trapping in micro-nano silicon-on-insulator waveguides
We numerically investigate the dispersive wave emission and soliton trapping in the process of femtosecond soliton propagation in silicon-on-insulator (SOI) waveguide. The cross-correlation frequency resolved optical gating (X-FROG) technique is employed to analyze the spectral–temporal dynamics of...
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Veröffentlicht in: | Optics and laser technology 2015-08, Vol.71, p.50-54 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We numerically investigate the dispersive wave emission and soliton trapping in the process of femtosecond soliton propagation in silicon-on-insulator (SOI) waveguide. The cross-correlation frequency resolved optical gating (X-FROG) technique is employed to analyze the spectral–temporal dynamics of the soliton at different propagation distances. The numerical results show that dispersive wave emission can be blue-shifted (around 1300nm) or red-shifted (around 1900nm), which is determined by the dispersion slope for the pump wavelength (1550nm). In addition, it can be found that red-shifted dispersive wave can supply contribution to the flatness of the supercontinuum generation. Through increasing the peak power of the soliton to 100W, the soliton trapping can be observed by the edge of dispersive wave, which can be visualized in the form of multi-peak oscillation structure in the spectrogram when not considering the two-photon absorption (TPA). This work opens up the possibility for the realization of dispersive wave emission device in highly integrated circuit.
•Investigate dispersive wave emission and soliton trapping by X-FROG technique.•Compare blue- and red-shifted dispersive wave under different dispersion slope.•Describe the multi-peak structure in spectrogram when not considering the TPA.•Open the possibility for the realization of optical device in integrated circuit. |
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ISSN: | 0030-3992 1879-2545 |
DOI: | 10.1016/j.optlastec.2015.02.009 |