The Ultrahigh Resolution IXS Beamline of NSLS-II: Recent Advances and Scientific Opportunities

The ultrahigh resolution IXS beamline of NSLS-II is designed to probe a region of dynamic response that requires an ultrahigh energy and momentum resolution of up to 0.1 meV and < 0.1 nm−1 respectively, which is currently still beyond the reach of existing low and high frequency inelastic scatter...

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Veröffentlicht in:Journal of physics. Conference series 2013-03, Vol.425 (20), p.202001-7
Hauptverfasser: Cai, Yong Q, Coburn, D S, Cunsolo, A, Keister, J W, Honnicke, M G, Huang, X R, Kodituwakku, C N, Stetsko, Y, Suvorov, A, Hiraoka, N, Tsuei, K D, Wille, H C
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Sprache:eng
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Zusammenfassung:The ultrahigh resolution IXS beamline of NSLS-II is designed to probe a region of dynamic response that requires an ultrahigh energy and momentum resolution of up to 0.1 meV and < 0.1 nm−1 respectively, which is currently still beyond the reach of existing low and high frequency inelastic scattering probes. Recent advances at NSLS-II in developing the required x-ray optics and instrumentation based on the use of extremely asymmetric Bragg back reflections of Si have allowed us to achieve sub-meV energy resolution with sharp tails and high efficiency at a medium energy of around 9.1 keV, thereby validating the optical design of the beamline for the baseline scope and paving the way for further development towards the ultimate goal of 0.1 meV. The IXS beamline is expected to provide a broad range of scientific opportunities, particularly in areas of liquid, disordered and bio-molecular systems.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/425/20/202001