Precision mechanical design of an ultrahigh-resolution inelastic x-ray scattering spectrometer system with CDFDW optics at the APS
There are many scientific applications, especially involving topics related to the equilibrium atomic-scale dynamics of condensed matter, that require both a narrower and a steeper resolution function and access to a broader dynamic range than are currently available. To meet these important scienti...
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Veröffentlicht in: | Journal of physics. Conference series 2013-01, Vol.425 (5), p.52031-4 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | There are many scientific applications, especially involving topics related to the equilibrium atomic-scale dynamics of condensed matter, that require both a narrower and a steeper resolution function and access to a broader dynamic range than are currently available. To meet these important scientific needs, a prototype of a novel ultrahigh-resolution inelastic x-ray scattering spectrometer system has been designed and constructed at undulator-based beamline 30-ID at the Advanced Photon Source, Argonne National Laboratory. This prototype is designed to meet challenging mechanical and optical specifications for performing so-called CDFDW angular-dispersive x-ray crystal optics, which include a central ultra-thin CFW crystal and a pair of dispersing elements. The abbreviation CDFDW stands for: C – collimating crystal, D – dispersing-element crystal (two D-crystals are used in each CDFDW), F – anomalous transmission filter, and W – wavelength-selector crystal [1]. The mechanical design of the ultrahigh-resolution inelastic x-ray scattering spectrometer, as well as the preliminary test results of its precision positioning performance are presented in this paper. |
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ISSN: | 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/425/5/052031 |