Probing the Nature of Defects in Graphene by Raman Spectroscopy
Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ra...
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| Veröffentlicht in: | Nano letters 2012-08, Vol.12 (8), p.3925-3930 |
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| container_end_page | 3930 |
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| container_issue | 8 |
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| container_title | Nano letters |
| container_volume | 12 |
| creator | Eckmann, Axel Felten, Alexandre Mishchenko, Artem Britnell, Liam Krupke, Ralph Novoselov, Kostya S Casiraghi, Cinzia |
| description | Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D′ peak is maximum (∼13) for sp3-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene. |
| doi_str_mv | 10.1021/nl300901a |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1762052906</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1762052906</sourcerecordid><originalsourceid>FETCH-LOGICAL-a444t-e1b000f19400a3eef24c4cb672888884f03988f87fc34b24e6d0d035e2d4a1643</originalsourceid><addsrcrecordid>eNqF0M9LwzAUB_AgipvTg_-A5CLooZpfTdOTyNQpDBV_nEuavriOrq1Je9h_b8bmdhHM5QXeh_eSL0KnlFxRwuh1XXFCUkL1HhrSmJNIpinb396VGKAj7-ckIB6TQzRgLJFCKTVEN6-uycv6C3czwM-66x3gxuI7sGA6j8saT5xuZ1ADzpf4TS90jd_b0HONN027PEYHVlceTjZ1hD4f7j_Gj9H0ZfI0vp1GWgjRRUDzsN3SVBCiOYBlwgiTy4Sp1RGW8FQpqxJruMiZAFmQgvAYWCE0lYKP0MV6buua7x58ly1Kb6CqdA1N7zOaSEZilhL5PyWcqVTxhAd6uaYmfMc7sFnryoV2y4CyVbTZNtpgzzZj-3wBxVb-ZhnA-QZob3Rlna5N6XdOMibCK3dOG5_Nm97VIbg_Fv4AZ2WJyA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1032898373</pqid></control><display><type>article</type><title>Probing the Nature of Defects in Graphene by Raman Spectroscopy</title><source>American Chemical Society Journals</source><creator>Eckmann, Axel ; Felten, Alexandre ; Mishchenko, Artem ; Britnell, Liam ; Krupke, Ralph ; Novoselov, Kostya S ; Casiraghi, Cinzia</creator><creatorcontrib>Eckmann, Axel ; Felten, Alexandre ; Mishchenko, Artem ; Britnell, Liam ; Krupke, Ralph ; Novoselov, Kostya S ; Casiraghi, Cinzia</creatorcontrib><description>Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D′ peak is maximum (∼13) for sp3-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.</description><identifier>ISSN: 1530-6984</identifier><identifier>EISSN: 1530-6992</identifier><identifier>DOI: 10.1021/nl300901a</identifier><identifier>PMID: 22764888</identifier><language>eng</language><publisher>Washington, DC: American Chemical Society</publisher><subject>Boundaries ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Defects ; Disorders ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals ; Exact sciences and technology ; Fullerenes and related materials; diamonds, graphite ; Graphene ; Graphite ; Materials science ; Nanostructure ; Physics ; Raman spectra ; Raman spectroscopy ; Specific materials</subject><ispartof>Nano letters, 2012-08, Vol.12 (8), p.3925-3930</ispartof><rights>Copyright © 2012 American Chemical Society</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a444t-e1b000f19400a3eef24c4cb672888884f03988f87fc34b24e6d0d035e2d4a1643</citedby><cites>FETCH-LOGICAL-a444t-e1b000f19400a3eef24c4cb672888884f03988f87fc34b24e6d0d035e2d4a1643</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/nl300901a$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/nl300901a$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26224762$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/22764888$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Eckmann, Axel</creatorcontrib><creatorcontrib>Felten, Alexandre</creatorcontrib><creatorcontrib>Mishchenko, Artem</creatorcontrib><creatorcontrib>Britnell, Liam</creatorcontrib><creatorcontrib>Krupke, Ralph</creatorcontrib><creatorcontrib>Novoselov, Kostya S</creatorcontrib><creatorcontrib>Casiraghi, Cinzia</creatorcontrib><title>Probing the Nature of Defects in Graphene by Raman Spectroscopy</title><title>Nano letters</title><addtitle>Nano Lett</addtitle><description>Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D′ peak is maximum (∼13) for sp3-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.</description><subject>Boundaries</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Defects</subject><subject>Disorders</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals</subject><subject>Exact sciences and technology</subject><subject>Fullerenes and related materials; diamonds, graphite</subject><subject>Graphene</subject><subject>Graphite</subject><subject>Materials science</subject><subject>Nanostructure</subject><subject>Physics</subject><subject>Raman spectra</subject><subject>Raman spectroscopy</subject><subject>Specific materials</subject><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqF0M9LwzAUB_AgipvTg_-A5CLooZpfTdOTyNQpDBV_nEuavriOrq1Je9h_b8bmdhHM5QXeh_eSL0KnlFxRwuh1XXFCUkL1HhrSmJNIpinb396VGKAj7-ckIB6TQzRgLJFCKTVEN6-uycv6C3czwM-66x3gxuI7sGA6j8saT5xuZ1ADzpf4TS90jd_b0HONN027PEYHVlceTjZ1hD4f7j_Gj9H0ZfI0vp1GWgjRRUDzsN3SVBCiOYBlwgiTy4Sp1RGW8FQpqxJruMiZAFmQgvAYWCE0lYKP0MV6buua7x58ly1Kb6CqdA1N7zOaSEZilhL5PyWcqVTxhAd6uaYmfMc7sFnryoV2y4CyVbTZNtpgzzZj-3wBxVb-ZhnA-QZob3Rlna5N6XdOMibCK3dOG5_Nm97VIbg_Fv4AZ2WJyA</recordid><startdate>20120808</startdate><enddate>20120808</enddate><creator>Eckmann, Axel</creator><creator>Felten, Alexandre</creator><creator>Mishchenko, Artem</creator><creator>Britnell, Liam</creator><creator>Krupke, Ralph</creator><creator>Novoselov, Kostya S</creator><creator>Casiraghi, Cinzia</creator><general>American Chemical Society</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20120808</creationdate><title>Probing the Nature of Defects in Graphene by Raman Spectroscopy</title><author>Eckmann, Axel ; Felten, Alexandre ; Mishchenko, Artem ; Britnell, Liam ; Krupke, Ralph ; Novoselov, Kostya S ; Casiraghi, Cinzia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a444t-e1b000f19400a3eef24c4cb672888884f03988f87fc34b24e6d0d035e2d4a1643</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Boundaries</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Defects</topic><topic>Disorders</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals</topic><topic>Exact sciences and technology</topic><topic>Fullerenes and related materials; diamonds, graphite</topic><topic>Graphene</topic><topic>Graphite</topic><topic>Materials science</topic><topic>Nanostructure</topic><topic>Physics</topic><topic>Raman spectra</topic><topic>Raman spectroscopy</topic><topic>Specific materials</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Eckmann, Axel</creatorcontrib><creatorcontrib>Felten, Alexandre</creatorcontrib><creatorcontrib>Mishchenko, Artem</creatorcontrib><creatorcontrib>Britnell, Liam</creatorcontrib><creatorcontrib>Krupke, Ralph</creatorcontrib><creatorcontrib>Novoselov, Kostya S</creatorcontrib><creatorcontrib>Casiraghi, Cinzia</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Eckmann, Axel</au><au>Felten, Alexandre</au><au>Mishchenko, Artem</au><au>Britnell, Liam</au><au>Krupke, Ralph</au><au>Novoselov, Kostya S</au><au>Casiraghi, Cinzia</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Probing the Nature of Defects in Graphene by Raman Spectroscopy</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2012-08-08</date><risdate>2012</risdate><volume>12</volume><issue>8</issue><spage>3925</spage><epage>3930</epage><pages>3925-3930</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D′ peak is maximum (∼13) for sp3-defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><pmid>22764888</pmid><doi>10.1021/nl300901a</doi><tpages>6</tpages></addata></record> |
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| subjects | Boundaries Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Defects Disorders Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals Exact sciences and technology Fullerenes and related materials diamonds, graphite Graphene Graphite Materials science Nanostructure Physics Raman spectra Raman spectroscopy Specific materials |
| title | Probing the Nature of Defects in Graphene by Raman Spectroscopy |
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