Controllable Atomic Scale Patterning of Freestanding Monolayer Graphene at Elevated Temperature

We show that by operating a scanning transmission electron microscope (STEM) with a 0.1 nm 300 kV electron beam, one can sculpt free-standing monolayer graphene with close-to-atomic precision at 600 °C. The same electron beam that is used for destructive sculpting can be used to image the sculpted m...

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Veröffentlicht in:ACS nano 2013-02, Vol.7 (2), p.1566-1572
Hauptverfasser: Xu, Qiang, Wu, Meng-Yue, Schneider, Grégory F, Houben, Lothar, Malladi, Sairam K, Dekker, Cees, Yucelen, Emrah, Dunin-Borkowski, Rafal E, Zandbergen, Henny W
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Sprache:eng
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Zusammenfassung:We show that by operating a scanning transmission electron microscope (STEM) with a 0.1 nm 300 kV electron beam, one can sculpt free-standing monolayer graphene with close-to-atomic precision at 600 °C. The same electron beam that is used for destructive sculpting can be used to image the sculpted monolayer graphene nondestructively. For imaging, a scanning dwell time is used that is about 1000 times shorter than for the sculpting. This approach allows for instantaneous switching between sculpting and imaging and thus fine-tuning the shape of the sculpted lattice. Furthermore, the sculpting process can be automated using a script. In this way, free-standing monolayer graphene can be controllably sculpted into patterns that are predefined in position, size, and orientation while maintaining defect-free crystallinity of the adjacent lattice. The sculpting and imaging processes can be fully computer-controlled to fabricate complex assemblies of ribbons or other shapes.
ISSN:1936-0851
1936-086X
DOI:10.1021/nn3053582