MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography

Hard X-ray micro-tomography is a powerful tool to reveal the internal structure of thick objects in a non-destructive manner. For synchrotron applications and practical lab works with students, a 2D detector based on a thin YAG:Ce scintillator optically coupled to a new generation high frame rate (1...

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Veröffentlicht in:Journal of instrumentation 2014-06, Vol.9 (6), p.C06001-C06001
Hauptverfasser: Desjardins, K, Bordessoule, M, Petrache, C, Menneglier, C, Dallé, D, Mercere, P, Medjoubi, K
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Sprache:eng
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Zusammenfassung:Hard X-ray micro-tomography is a powerful tool to reveal the internal structure of thick objects in a non-destructive manner. For synchrotron applications and practical lab works with students, a 2D detector based on a thin YAG:Ce scintillator optically coupled to a new generation high frame rate (100 fps) low noise sCMOS camera has been developed and characterized in depth on the METROLOGIE and PSICHE beamlines of the SOLEIL synchrotron. The Detector gain, Modulation Transfer Function, Noise Power Spectrum and Detective Quantum Efficiency have been measured and compared with analytical model. A tomography reconstruction was performed on small insects to demonstrate the performance of this X-ray imaging detector.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/9/06/C06001