Correcting multi material artifacts from single material phase retrieved holo-tomograms with a simple 3D Fourier method

Here we present a method for the removal of multi-material artifacts which occur during the application of a single material phase retrieval procedure to X-ray tomographic data sets. For the phase retrieval we chose the most common method which is the single material filter. The correction method wh...

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Veröffentlicht in:Optics express 2015-12, Vol.23 (25), p.32718-32727
Hauptverfasser: Ullherr, Maximilian, Zabler, Simon
Format: Artikel
Sprache:eng
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Zusammenfassung:Here we present a method for the removal of multi-material artifacts which occur during the application of a single material phase retrieval procedure to X-ray tomographic data sets. For the phase retrieval we chose the most common method which is the single material filter. The correction method which we describe in the following has been designed for samples consisting of three distinct materials, hence effectively two different material interfaces. Furthermore the material phase with the strongest X-ray interaction needs to show sufficient absorption in order to allow for segmenting this phase through application of a grey value threshold. If these conditions are fulfilled the method is easy to apply through post processing as is shown for the volume images of two sample types.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.23.032718