Using ferrule-top opto-mechanical probes as a new tool in VCSEL reliability experiments

Today, vertical cavity surface emitting lasers (VCSELs) are used in many high-end applications, for which the laser lifetime is a critical parameter. Changes in the spatial distribution of the various emission modes of the VCSEL can be used as an early sign of device degradation, enhancing the speed...

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Veröffentlicht in:Optics express 2015-11, Vol.23 (23), p.30318-30328
Hauptverfasser: van Hoorn, Camiel H, Ariese, Freek, Iannuzzi, Davide, Mank, Arjan J G
Format: Artikel
Sprache:eng
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Zusammenfassung:Today, vertical cavity surface emitting lasers (VCSELs) are used in many high-end applications, for which the laser lifetime is a critical parameter. Changes in the spatial distribution of the various emission modes of the VCSEL can be used as an early sign of device degradation, enhancing the speed and detail of failure mode analysis. We have developed a ferrule-top combined atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) probe that can be used to analyze the transverse mode pattern of the 850 nm radiation at a
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.23.030318