Spin-dependent scattering of conduction electrons in Co/Cu multilayers

The magnetotransport properties of giant magnetoresistive Co/Cu multilayers with Cu layer thickness tCu varied from 8 to 27Å are studied using the magnetorefractive effect. Interfacial relaxation times τi↑(↓) and scattering probabilities Pi↑(↓), and interface scattering asymmetry γCo/Cu of conductio...

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Veröffentlicht in:Journal of magnetism and magnetic materials 2015-09, Vol.389, p.169-175
Hauptverfasser: Lobov, I.D., Kirillova, M.M., Makhnev, A.A., Milyaev, M.A., Romashev, L.N., Ustinov, V.V.
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Sprache:eng
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Zusammenfassung:The magnetotransport properties of giant magnetoresistive Co/Cu multilayers with Cu layer thickness tCu varied from 8 to 27Å are studied using the magnetorefractive effect. Interfacial relaxation times τi↑(↓) and scattering probabilities Pi↑(↓), and interface scattering asymmetry γCo/Cu of conduction electron were obtained from the magnetoreflection in the intraband absorption region. The greatest changes of τi and Pi occur in a spin-up current channel with increasing tCu. Due to a size quantization of transverse component of a quasi-momentum of free electrons in Cu layers, the magnitude of τi↑ oscillates reaching the maximum values at tCu corresponding to the first two peaks of antiferromagnetic interlayer exchange coupling, while the τi↓ experiences only slight changes keeping low values at all thicknesses of Cu layer. It was found that condition τi↑≈τCu is critical to minimize the scattering of spin-up conduction electrons at Co/Cu interface. In this case, in the region of the first peak of antiferromagnetic interlayer exchange the spin asymmetry coefficient γ≈0.86, and the probability of electron scattering Pi↑ is approximately equal to 0.02, which ensures the maximum values of giant magnetoresistance and magnetorefractive effect. •We measured magnetorefractive effect (optical analogue of GMR) in Co/Cu multilayers.•Parameters of spin-dependent scattering of conduction electrons were defined.•Conditions are discussed to minimize scattering and to maximize MRE and GMR in Co/Cu.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2015.04.063