Development of technique for three-dimensional visualization of grain boundaries by white X-ray microbeam

A technique for three-dimensional visualization of grain boundaries was developed at BL28B2 at SPring-8. The technique uses white X-ray microbeam diffraction and a rotating slit. Three-dimensional images of small silicon single crystals filled in a plastic tube were successfully obtained using this...

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Veröffentlicht in:	Journal of physics. Conference series 2014-01, Vol.502 (1), p.1-4
Hauptverfasser:	Kajiwara, K, Shobu, T, Toyokawa, H, Sato, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Computed tomography Crystals Diffraction Grain boundaries Microbeams Physics Single crystals Slits Three dimensional Visualization X-rays
Online-Zugang:	Volltext
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