Development of technique for three-dimensional visualization of grain boundaries by white X-ray microbeam

Development of technique for three-dimensional visualization of grain boundaries by white X-ray microbeam

A technique for three-dimensional visualization of grain boundaries was developed at BL28B2 at SPring-8. The technique uses white X-ray microbeam diffraction and a rotating slit. Three-dimensional images of small silicon single crystals filled in a plastic tube were successfully obtained using this...

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Veröffentlicht in:Journal of physics. Conference series 2014-01, Vol.502 (1), p.1-4
Hauptverfasser: Kajiwara, K, Shobu, T, Toyokawa, H, Sato, M
Format: Artikel
Sprache:eng
Schlagworte:
Computed tomography
Crystals
Diffraction
Grain boundaries
Microbeams
Physics
Single crystals
Slits
Three dimensional
Visualization
X-rays
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Zusammenfassung:A technique for three-dimensional visualization of grain boundaries was developed at BL28B2 at SPring-8. The technique uses white X-ray microbeam diffraction and a rotating slit. Three-dimensional images of small silicon single crystals filled in a plastic tube were successfully obtained using this technique for demonstration purposes. The images were consistent with those obtained by X-ray computed tomography.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/502/1/012020