Dielectric characterization of thin films using microstrip ring resonators

Dielectric characterization of thin films using microstrip ring resonators

ABSTRACT This article presents a microstrip ring resonator technique for characterizing thin film substrates up to 110 GHz. A coupling structure was designed to efficiently couple energy into rings despite the tight microstrip‐substrate confinement. Various ring sizes are designed and fabricated, an...

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Veröffentlicht in:Microwave and optical technology letters 2015-10, Vol.57 (10), p.2306-2310
Hauptverfasser: Eng, David L. K., Olbricht, Benjamin C., Shi, Shouyuan, Prather, Dennis W.
Format: Artikel
Sprache:eng
Schlagworte:
capacitive coupling
Confinement
Dielectric constant
dielectric loss
Dielectrics
Joining
Microwaves
Resonators
ring resonators
Tangents
thin film substrates
Thin films
transmission lines
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Zusammenfassung:ABSTRACT This article presents a microstrip ring resonator technique for characterizing thin film substrates up to 110 GHz. A coupling structure was designed to efficiently couple energy into rings despite the tight microstrip‐substrate confinement. Various ring sizes are designed and fabricated, and both dielectric constant and loss tangent results are presented. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:2306–2310, 2015
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.29321