Calculation of the spatial distribution of defects and cascade- probability functions in the materials

In this article we carried out the calculations of the depth distribution of implanted ions of arsenic and indium, loss of energy and cascade-probability functions in silicon. Comparison of the calculations with the experimental data is in the satisfactory agreement. The computer simulation and anal...

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Veröffentlicht in:Journal of physics. Conference series 2014-01, Vol.552 (1), p.12047-7
Hauptverfasser: Kupchishin, A I, Kupchishin, A A, Shmygalev, E V, Shmygaleva, T A, Tlebaev, K B
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Sprache:eng
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Zusammenfassung:In this article we carried out the calculations of the depth distribution of implanted ions of arsenic and indium, loss of energy and cascade-probability functions in silicon. Comparison of the calculations with the experimental data is in the satisfactory agreement. The computer simulation and analysis of the characteristics of ions depending on the depth of penetration and the number of interactions were carried out.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/552/1/012047