Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications

Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insigh...

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Veröffentlicht in:	Journal of physics. Conference series 2013-01, Vol.471, p.1-4
Hauptverfasser:	Oleshko, V P, Williams, E H, Davydov, A V, Krylyuk, S, Motayed, A, Ruzmetov, D, Lam, T, Lezec, H J, Talin, A A
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic structure Devices Mathematical analysis Morphology Nanostructure Scanning electron microscopy Semiconductors Wire
Online-Zugang:	Volltext
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