Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications

Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insigh...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of physics. Conference series 2013-01, Vol.471, p.1-4
Hauptverfasser: Oleshko, V P, Williams, E H, Davydov, A V, Krylyuk, S, Motayed, A, Ruzmetov, D, Lam, T, Lezec, H J, Talin, A A
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insights into the morphology, crystalline and electronic structures and chemical composition of single-crystalline high-aspect-ratio SNWs as prospective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance and the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/471/1/012017