Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications
Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insigh...
Gespeichert in:
Veröffentlicht in: | Journal of physics. Conference series 2013-01, Vol.471, p.1-4 |
---|---|
Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 4 |
---|---|
container_issue | |
container_start_page | 1 |
container_title | Journal of physics. Conference series |
container_volume | 471 |
creator | Oleshko, V P Williams, E H Davydov, A V Krylyuk, S Motayed, A Ruzmetov, D Lam, T Lezec, H J Talin, A A |
description | Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insights into the morphology, crystalline and electronic structures and chemical composition of single-crystalline high-aspect-ratio SNWs as prospective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance and the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes. |
doi_str_mv | 10.1088/1742-6596/471/1/012017 |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1718924459</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1718924459</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_17189244593</originalsourceid><addsrcrecordid>eNqVjUFLAzEUhIMoWKt_Qd7RS9287bbJHotu8VIv9l5C-lYiad6aZJX990aQ3p3LDMw3jBD3KB9Ral2haurFetWuq0ZhhZXEWqK6ELNzcXnOWl-Lm5Q-pFwWqZmIm2D8lJ01HjpPNkcOsHM2crI8TMA9vNHJWQ7H0WaO8GoCw7eLBNsx2Oy47GFnMkVnfAITjvBMX85Sgr7gXaD4PsFmGHz5-MXTrbjqC0p3fz4XD9tu__SyGCJ_jpTy4eSSJe9NIB7TARXqtm6aVbv8B_oDuApXjA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1718924459</pqid></control><display><type>article</type><title>Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>Institute of Physics Open Access Journal Titles</source><source>IOPscience extra</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Oleshko, V P ; Williams, E H ; Davydov, A V ; Krylyuk, S ; Motayed, A ; Ruzmetov, D ; Lam, T ; Lezec, H J ; Talin, A A</creator><creatorcontrib>Oleshko, V P ; Williams, E H ; Davydov, A V ; Krylyuk, S ; Motayed, A ; Ruzmetov, D ; Lam, T ; Lezec, H J ; Talin, A A</creatorcontrib><description>Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insights into the morphology, crystalline and electronic structures and chemical composition of single-crystalline high-aspect-ratio SNWs as prospective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance and the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/471/1/012017</identifier><language>eng</language><subject>Atomic structure ; Devices ; Mathematical analysis ; Morphology ; Nanostructure ; Scanning electron microscopy ; Semiconductors ; Wire</subject><ispartof>Journal of physics. Conference series, 2013-01, Vol.471, p.1-4</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Oleshko, V P</creatorcontrib><creatorcontrib>Williams, E H</creatorcontrib><creatorcontrib>Davydov, A V</creatorcontrib><creatorcontrib>Krylyuk, S</creatorcontrib><creatorcontrib>Motayed, A</creatorcontrib><creatorcontrib>Ruzmetov, D</creatorcontrib><creatorcontrib>Lam, T</creatorcontrib><creatorcontrib>Lezec, H J</creatorcontrib><creatorcontrib>Talin, A A</creatorcontrib><title>Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications</title><title>Journal of physics. Conference series</title><description>Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insights into the morphology, crystalline and electronic structures and chemical composition of single-crystalline high-aspect-ratio SNWs as prospective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance and the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes.</description><subject>Atomic structure</subject><subject>Devices</subject><subject>Mathematical analysis</subject><subject>Morphology</subject><subject>Nanostructure</subject><subject>Scanning electron microscopy</subject><subject>Semiconductors</subject><subject>Wire</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNqVjUFLAzEUhIMoWKt_Qd7RS9287bbJHotu8VIv9l5C-lYiad6aZJX990aQ3p3LDMw3jBD3KB9Ral2haurFetWuq0ZhhZXEWqK6ELNzcXnOWl-Lm5Q-pFwWqZmIm2D8lJ01HjpPNkcOsHM2crI8TMA9vNHJWQ7H0WaO8GoCw7eLBNsx2Oy47GFnMkVnfAITjvBMX85Sgr7gXaD4PsFmGHz5-MXTrbjqC0p3fz4XD9tu__SyGCJ_jpTy4eSSJe9NIB7TARXqtm6aVbv8B_oDuApXjA</recordid><startdate>20130101</startdate><enddate>20130101</enddate><creator>Oleshko, V P</creator><creator>Williams, E H</creator><creator>Davydov, A V</creator><creator>Krylyuk, S</creator><creator>Motayed, A</creator><creator>Ruzmetov, D</creator><creator>Lam, T</creator><creator>Lezec, H J</creator><creator>Talin, A A</creator><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20130101</creationdate><title>Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications</title><author>Oleshko, V P ; Williams, E H ; Davydov, A V ; Krylyuk, S ; Motayed, A ; Ruzmetov, D ; Lam, T ; Lezec, H J ; Talin, A A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_17189244593</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Atomic structure</topic><topic>Devices</topic><topic>Mathematical analysis</topic><topic>Morphology</topic><topic>Nanostructure</topic><topic>Scanning electron microscopy</topic><topic>Semiconductors</topic><topic>Wire</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oleshko, V P</creatorcontrib><creatorcontrib>Williams, E H</creatorcontrib><creatorcontrib>Davydov, A V</creatorcontrib><creatorcontrib>Krylyuk, S</creatorcontrib><creatorcontrib>Motayed, A</creatorcontrib><creatorcontrib>Ruzmetov, D</creatorcontrib><creatorcontrib>Lam, T</creatorcontrib><creatorcontrib>Lezec, H J</creatorcontrib><creatorcontrib>Talin, A A</creatorcontrib><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oleshko, V P</au><au>Williams, E H</au><au>Davydov, A V</au><au>Krylyuk, S</au><au>Motayed, A</au><au>Ruzmetov, D</au><au>Lam, T</au><au>Lezec, H J</au><au>Talin, A A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications</atitle><jtitle>Journal of physics. Conference series</jtitle><date>2013-01-01</date><risdate>2013</risdate><volume>471</volume><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>Functionalized individual semiconductor nano wires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (scanning) transmission electron microscopy ((S)TEM) enables critical insights into the morphology, crystalline and electronic structures and chemical composition of single-crystalline high-aspect-ratio SNWs as prospective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance and the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes.</abstract><doi>10.1088/1742-6596/471/1/012017</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1742-6588 |
ispartof | Journal of physics. Conference series, 2013-01, Vol.471, p.1-4 |
issn | 1742-6588 1742-6596 |
language | eng |
recordid | cdi_proquest_miscellaneous_1718924459 |
source | Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Institute of Physics Open Access Journal Titles; IOPscience extra; Alma/SFX Local Collection; Free Full-Text Journals in Chemistry |
subjects | Atomic structure Devices Mathematical analysis Morphology Nanostructure Scanning electron microscopy Semiconductors Wire |
title | Analytical Electron Microscopy of Semiconductor Nano wire Functional Materials and Devices for Energy Applications |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T20%3A17%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analytical%20Electron%20Microscopy%20of%20Semiconductor%20Nano%20wire%20Functional%20Materials%20and%20Devices%20for%20Energy%20Applications&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Oleshko,%20V%20P&rft.date=2013-01-01&rft.volume=471&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/471/1/012017&rft_dat=%3Cproquest%3E1718924459%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1718924459&rft_id=info:pmid/&rfr_iscdi=true |