Linear systems approach to describing and classifying Fano resonances
We show that a generalized asymmetric resonant line shape derived elsewhere from rigorous electromagnetic calculations [Gallinet and Martin, Phys. Rev. B 83, 235427 (2011) (http://dx.doi.org/10.1103/PhysRevB.83.235427)] and from the two-oscillators model [Joe et al., Phys. Scr. 74, 259 (2006) (http:...
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Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2013-03, Vol.87 (12), Article 125118 |
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Sprache: | eng |
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Zusammenfassung: | We show that a generalized asymmetric resonant line shape derived elsewhere from rigorous electromagnetic calculations [Gallinet and Martin, Phys. Rev. B 83, 235427 (2011) (http://dx.doi.org/10.1103/PhysRevB.83.235427)] and from the two-oscillators model [Joe et al., Phys. Scr. 74, 259 (2006) (http://dx.doi.org/10.1088/0031-8949/74/2/020)] can also be obtained using a very general assumption that the spectral dependence of the scattering amplitudes is given by the transfer function of a linear system. We reformulate the line shape equation and show that in the case of a first-order transfer function all possible line shapes can be presented by a weighted sum of the original Fano and Lorentzian line shapes. We propose a new two-parameter classification scheme for asymmetric resonances with one parameter o being the asymmetry factor of the Fano component and the other parameter [eta] quantifying the relative weight of the Fano and Lorentzian components of the line shape. The proposed formula is used to fit experimental spectra of a silicon photonic crystal cavity nanobeam interrogated using a fiber taper probe. |
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ISSN: | 1098-0121 1550-235X |
DOI: | 10.1103/PhysRevB.87.125118 |