Low-Dimensional Structure Vacuum-Ultraviolet-Sensitive (λ < 200 nm) Photodetector with Fast-Response Speed Based on High-Quality AlN Micro/Nanowire

A low‐dimensional‐structure vacuum‐ultraviolet‐sensitive photodetector based on high‐quality aluminum nitride (AlN) micro‐/nanowires is reported. This work, for the first time, demonstrates that a semiconductor nanostructure can be applied in vacuum‐ultraviolet (VUV) photon detection and opens a way...

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Veröffentlicht in:Advanced materials (Weinheim) 2015-07, Vol.27 (26), p.3921-3927
Hauptverfasser: Zheng, Wei, Huang, Feng, Zheng, Ruisheng, Wu, Honglei
Format: Artikel
Sprache:eng
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Zusammenfassung:A low‐dimensional‐structure vacuum‐ultraviolet‐sensitive photodetector based on high‐quality aluminum nitride (AlN) micro‐/nanowires is reported. This work, for the first time, demonstrates that a semiconductor nanostructure can be applied in vacuum‐ultraviolet (VUV) photon detection and opens a way for developing diminutive, power‐saving, and low‐cost VUV materials and sensors that can be potentially applied in geospace sciences and solar‐terrestrial physics.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201500268