Extraction of optical constants using multiple reflections in the terahertz emitter-sample hybrid structure

To extract optical constants of nontransmitted samples in the terahertz (THz) spectral region, we employ a THz emitter-sample hybrid structure where THz pulses are generated at the emitter surface and multiply reflected at the interface between the THz emitter and the sample. Since each THz electric field profile appears well separated in a time domain, we could obtain the amplitude and phase spectra for each pulse from the Fourier transform, and determine the optical constants of the sample numerically based on the Fresnel equations. We applied this technique for doped semiconductors, and found that obtained optical constants are in good agreement with the values determined by using other conventional THz techniques.