Electronic structure of YbNiX sub(3) (X =Si, Ge) studied by hard X-ray photoemission spectroscopy

lectronic structure of the Kondo lattices YbNiX sub(3) (X =Si, Ge) has been investigated by means of hard x-ray photoemission spectroscopy (HAXPES) with h nu = 5.95 keV. From the Yb 3d HAXPES spectra, the Yb valence in YbNiSi sub(3) is estimated to be 2.92, which is almost temperature-independent. O...

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Veröffentlicht in:Physica status solidi. C 2015-06, Vol.12 (6), p.620-623
Hauptverfasser: Sato, Hitoshi, Utsumi, Yuki, Kodama, Junichi, Nagata, Heisuke, Avila, Marcos A, Ribeiro, Raquel A, Umeo, Kazunori, Takabatake, Toshiro, Mimura, Kojiro, Motonami, Satoru, Anzai, Hiroaki, Ueda, Shigenori, Shimada, Kenya, Namatame, Hirofumi, Taniguchi, Masaki
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Sprache:eng
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Zusammenfassung:lectronic structure of the Kondo lattices YbNiX sub(3) (X =Si, Ge) has been investigated by means of hard x-ray photoemission spectroscopy (HAXPES) with h nu = 5.95 keV. From the Yb 3d HAXPES spectra, the Yb valence in YbNiSi sub(3) is estimated to be 2.92, which is almost temperature-independent. On the other hand, the valence in YbNiGe sub(3) is estimated to be 2.48 at 300 K, showing significant valence fluctuation, and gradually decreases to 2.41 at 20 K on cooling. The Ni 2p sub(3/2) and Yb super(3+) 4f peaks exhibit opposite energy shifts amounting to 0.6 eV between YbNiSi sub(3) and YbNiGe sub(3). We propose a simple model for the electronic structure of YbNiX sub(3) based on the HAXPES results. ( copyright 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:1862-6351
1610-1642
DOI:10.1002/pssc.201400312