Junction Temperature Measurement of IGBTs Using Short-Circuit Current as a Temperature-Sensitive Electrical Parameter for Converter Prototype Evaluation

This paper proposes a method to measure the junction temperatures of insulated-gate bipolar transistors (IGBTs) during the converter operation for prototype evaluation. The IGBT short-circuit current is employed as the temperature-sensitive electrical parameter (TSEP). The calibration experiments sh...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on industrial electronics (1982) 2015-06, Vol.62 (6), p.3419-3429
Hauptverfasser: Xu, Zhuxian, Xu, Fan, Wang, FeiFred
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper proposes a method to measure the junction temperatures of insulated-gate bipolar transistors (IGBTs) during the converter operation for prototype evaluation. The IGBT short-circuit current is employed as the temperature-sensitive electrical parameter (TSEP). The calibration experiments show that the short-circuit current has an adequate temperature sensitivity of 0.35 A/°C. The parameter also has good selectivity and linearity, which makes it suitable to be used as a TSEP. Test circuit and hardware design are proposed for the IGBT junction temperature measurement in various power electronics dc-dc and ac-dc converter applications. By connecting a temperature measurement unit to the converter and giving a short-circuit pulse during the converter operation, the short-circuit current is measured, and the IGBT junction temperature can be derived from the calibration curve. The proposed temperature measurement method is a valuable tool for prototype evaluation and avoids the unnecessary safety margin regarding device operating temperatures, which is significant particularly for high-temperature/high-density converter applications.
ISSN:0278-0046
1557-9948
DOI:10.1109/TIE.2014.2374575