Vacancy defects in epitaxial thin film CuGaSe sub(2) and CuInSe sub(2)

Epitaxial thin film CuGaSe sub(2) and CuInSe sub(2) samples grown on GaAs substrates with varying [Cu]/[Ga,In] ratios were studied using positron annihilation Doppler-broadening spectroscopy and were compared to bulk crystals. We find both Cu monovacancies and Cu-Se divacancies in CuInSe sub(2), whe...

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Veröffentlicht in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2012-08, Vol.86 (6)
Hauptverfasser: Korhonen, E, Kuitunen, K, Tuomisto, F, Urbaniak, A, Igalson, M, Larsen, J, Gutay, L, Siebentritt, S, Tomm, Y
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Sprache:eng
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Zusammenfassung:Epitaxial thin film CuGaSe sub(2) and CuInSe sub(2) samples grown on GaAs substrates with varying [Cu]/[Ga,In] ratios were studied using positron annihilation Doppler-broadening spectroscopy and were compared to bulk crystals. We find both Cu monovacancies and Cu-Se divacancies in CuInSe sub(2), whereas, in CuGaSe sub(2), the only observed vacancy defect is the Cu-Se divacancy.
ISSN:1098-0121
1550-235X