A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source

A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐str...

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Veröffentlicht in:	Journal of synchrotron radiation 2015-09, Vol.22 (5), p.1306-1311
Hauptverfasser:	Sung, Nark-Eon, Lee, Ik-Jae, Lee, Kug-Seong, Jeong, Seong-Hun, Kang, Seen-Woong, Shin, Yong-Bi
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Sprache:	eng
Schlagworte:	micro-XANES micro-XRF microprobe X-ray instrumentation X-rays XAFS
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container_issue	5
container_start_page	1306
container_title	Journal of synchrotron radiation
container_volume	22
creator	Sung, Nark-Eon Lee, Ik-Jae Lee, Kug-Seong Jeong, Seong-Hun Kang, Seen-Woong Shin, Yong-Bi
description	A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐structure (XAFS) experiments. For high‐spatial‐resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter‐sized X‐ray beam to a micrometer‐sized beam. The performance of this system was examined by a combination of micro‐XRF imaging and micro‐XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.
doi_str_mv	10.1107/S1600577515014071
format	Article
fullrecord	<record><control><sourceid>proquest_24P</sourceid><recordid>TN_cdi_proquest_miscellaneous_1705732803</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1705732803</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4600-cb3769dbea9932a8c13be3d6d273fa3def6aa29102d61569a86af83ff2233c743</originalsourceid><addsrcrecordid>eNqFkEtPwzAQhC0Eorx-ABdkiQuXgB-NHR9LRVtQgEJBBS6WkzhtIGmKnQj673EoVAgOnHa1-mY0OwDsY3SMMeInI8wQ8jn3sY9wG3G8Braak9fc1n_sLbBt7TNCmHFCN0GLMBIIEvhbYNyBto68IotNWehKG2i0LfO6ysoZnCqTwAfPqAX8BOamjDS0C1vpApYpPA2DLlQVHJZTNZvAMJtMKzgqaxPrXbCRqtzqva-5A-57Z3fdgRde98-7ndCL2024OKKciSTSSghKVBBjGmmasIRwmiqa6JQpRQRGJGHYZ0IFTKUBTVNCKI15m-6Ao6Wvy_Zaa1vJIrOxznM102VtJeauIEoCRB16-At9dlFnLt0nxdqC-MhReEm5f601OpVzkxXKLCRGsmld_mndaQ6-nOuo0MlK8V2zA8QSeMtyvfjfUV6MHsmg5xPRBPKW2szV_r7SKvMiGafcl-OrvqTD25uny7uBDOkHwFaahA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1705649250</pqid></control><display><type>article</type><title>A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source</title><source>Wiley Online Library Open Access</source><creator>Sung, Nark-Eon ; Lee, Ik-Jae ; Lee, Kug-Seong ; Jeong, Seong-Hun ; Kang, Seen-Woong ; Shin, Yong-Bi</creator><creatorcontrib>Sung, Nark-Eon ; Lee, Ik-Jae ; Lee, Kug-Seong ; Jeong, Seong-Hun ; Kang, Seen-Woong ; Shin, Yong-Bi</creatorcontrib><description>A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐structure (XAFS) experiments. For high‐spatial‐resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter‐sized X‐ray beam to a micrometer‐sized beam. The performance of this system was examined by a combination of micro‐XRF imaging and micro‐XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.</description><identifier>ISSN: 1600-5775</identifier><identifier>ISSN: 0909-0495</identifier><identifier>EISSN: 1600-5775</identifier><identifier>DOI: 10.1107/S1600577515014071</identifier><identifier>PMID: 26289285</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>micro-XANES ; micro-XRF ; microprobe ; X-ray instrumentation ; X-rays ; XAFS</subject><ispartof>Journal of synchrotron radiation, 2015-09, Vol.22 (5), p.1306-1311</ispartof><rights>International Union of Crystallography, 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4600-cb3769dbea9932a8c13be3d6d273fa3def6aa29102d61569a86af83ff2233c743</citedby><cites>FETCH-LOGICAL-c4600-cb3769dbea9932a8c13be3d6d273fa3def6aa29102d61569a86af83ff2233c743</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS1600577515014071$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS1600577515014071$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,11541,27901,27902,45550,45551,46027,46451</link.rule.ids><linktorsrc>$$Uhttps://onlinelibrary.wiley.com/doi/abs/10.1107%2FS1600577515014071$$EView_record_in_Wiley-Blackwell$$FView_record_in_$$GWiley-Blackwell</linktorsrc><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/26289285$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sung, Nark-Eon</creatorcontrib><creatorcontrib>Lee, Ik-Jae</creatorcontrib><creatorcontrib>Lee, Kug-Seong</creatorcontrib><creatorcontrib>Jeong, Seong-Hun</creatorcontrib><creatorcontrib>Kang, Seen-Woong</creatorcontrib><creatorcontrib>Shin, Yong-Bi</creatorcontrib><title>A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source</title><title>Journal of synchrotron radiation</title><addtitle>Jnl of Synchrotron Radiation</addtitle><description>A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐structure (XAFS) experiments. For high‐spatial‐resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter‐sized X‐ray beam to a micrometer‐sized beam. The performance of this system was examined by a combination of micro‐XRF imaging and micro‐XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.</description><subject>micro-XANES</subject><subject>micro-XRF</subject><subject>microprobe</subject><subject>X-ray instrumentation</subject><subject>X-rays</subject><subject>XAFS</subject><issn>1600-5775</issn><issn>0909-0495</issn><issn>1600-5775</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqFkEtPwzAQhC0Eorx-ABdkiQuXgB-NHR9LRVtQgEJBBS6WkzhtIGmKnQj673EoVAgOnHa1-mY0OwDsY3SMMeInI8wQ8jn3sY9wG3G8Braak9fc1n_sLbBt7TNCmHFCN0GLMBIIEvhbYNyBto68IotNWehKG2i0LfO6ysoZnCqTwAfPqAX8BOamjDS0C1vpApYpPA2DLlQVHJZTNZvAMJtMKzgqaxPrXbCRqtzqva-5A-57Z3fdgRde98-7ndCL2024OKKciSTSSghKVBBjGmmasIRwmiqa6JQpRQRGJGHYZ0IFTKUBTVNCKI15m-6Ao6Wvy_Zaa1vJIrOxznM102VtJeauIEoCRB16-At9dlFnLt0nxdqC-MhReEm5f601OpVzkxXKLCRGsmld_mndaQ6-nOuo0MlK8V2zA8QSeMtyvfjfUV6MHsmg5xPRBPKW2szV_r7SKvMiGafcl-OrvqTD25uny7uBDOkHwFaahA</recordid><startdate>20150901</startdate><enddate>20150901</enddate><creator>Sung, Nark-Eon</creator><creator>Lee, Ik-Jae</creator><creator>Lee, Kug-Seong</creator><creator>Jeong, Seong-Hun</creator><creator>Kang, Seen-Woong</creator><creator>Shin, Yong-Bi</creator><general>International Union of Crystallography</general><general>John Wiley & Sons, Inc</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20150901</creationdate><title>A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source</title><author>Sung, Nark-Eon ; Lee, Ik-Jae ; Lee, Kug-Seong ; Jeong, Seong-Hun ; Kang, Seen-Woong ; Shin, Yong-Bi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4600-cb3769dbea9932a8c13be3d6d273fa3def6aa29102d61569a86af83ff2233c743</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>micro-XANES</topic><topic>micro-XRF</topic><topic>microprobe</topic><topic>X-ray instrumentation</topic><topic>X-rays</topic><topic>XAFS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sung, Nark-Eon</creatorcontrib><creatorcontrib>Lee, Ik-Jae</creatorcontrib><creatorcontrib>Lee, Kug-Seong</creatorcontrib><creatorcontrib>Jeong, Seong-Hun</creatorcontrib><creatorcontrib>Kang, Seen-Woong</creatorcontrib><creatorcontrib>Shin, Yong-Bi</creatorcontrib><collection>Istex</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of synchrotron radiation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sung, Nark-Eon</au><au>Lee, Ik-Jae</au><au>Lee, Kug-Seong</au><au>Jeong, Seong-Hun</au><au>Kang, Seen-Woong</au><au>Shin, Yong-Bi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source</atitle><jtitle>Journal of synchrotron radiation</jtitle><addtitle>Jnl of Synchrotron Radiation</addtitle><date>2015-09-01</date><risdate>2015</risdate><volume>22</volume><issue>5</issue><spage>1306</spage><epage>1311</epage><pages>1306-1311</pages><issn>1600-5775</issn><issn>0909-0495</issn><eissn>1600-5775</eissn><abstract>A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS‐II, South Korea. Owing to the reproducible switch of the gap of the in‐vacuum undulator (IVU), the intense and brilliant hard X‐ray beam of an IVU can be used in X‐ray fluorescence (XRF) and X‐ray absorption fine‐structure (XAFS) experiments. For high‐spatial‐resolution microprobe experiments a Kirkpatrick–Baez mirror system has been used to focus the millimeter‐sized X‐ray beam to a micrometer‐sized beam. The performance of this system was examined by a combination of micro‐XRF imaging and micro‐XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><pmid>26289285</pmid><doi>10.1107/S1600577515014071</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record>
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title	A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T13%3A26%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_24P&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20sub-micrometer%20resolution%20hard%20X-ray%20microprobe%20system%20of%20BL8C%20at%20Pohang%20Light%20Source&rft.jtitle=Journal%20of%20synchrotron%20radiation&rft.au=Sung,%20Nark-Eon&rft.date=2015-09-01&rft.volume=22&rft.issue=5&rft.spage=1306&rft.epage=1311&rft.pages=1306-1311&rft.issn=1600-5775&rft.eissn=1600-5775&rft_id=info:doi/10.1107/S1600577515014071&rft_dat=%3Cproquest_24P%3E1705732803%3C/proquest_24P%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1705649250&rft_id=info:pmid/26289285&rfr_iscdi=true